Purchase your copy of ASTM E – 02() as a PDF download or hard copy directly from the official BSI Shop. All BSI British Standards. Find the most up-to-date version of ASTM E at Engineering ASTM E – E – 02 The test methods provide for reporting of specic, distinctive informati.
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The grain size and area fraction values shown in that report format correspond to the appearance of the photomicrograph shown. Click here to display results spreadsheet.
Any estimates of area fractions arising from this procedure are valid for an entire specimen only if they fulll the requirements of 8. Further suppose that measurements indicate an average depth of that surface layer of 1. Your comments will receive careful consideration at a meeting of the responsible technical committee, which you may attend. Reduce that error by using graded area fraction comparison gures see Fig. An example of a complete report might read: Then use the planimeter to measure the area enclosed within each outlined region.
These procedures will be more difficult to apply than the Comparison Procedure of E, but will offer greater precision. If the specimen being examined is the full cross-section of a round bar, the longitudinal section should not be used to estimate the area fraction occupied by different grain sizes.
This standard does not purport to address all of the safety concerns associated with its use. The area occupied by the ne grains is what must be determined. Examples of topological duplex grain sizes include: Link to Active This link will always route to the current Active version of the standard. Use the lowest magnication that allows visual resolution of the coarse- and ne-grained areas as distinct regions.
The layer depth of 3. Choose any of several preparation functions with a single mouse click. Use of the grid is described in 8.
ASTM E – 02() Standard Test Methods for Characterizing Duplex Grain Sizes
If additional traverses can be made, they will improve the precision of the nal area fraction estimate. Assigning an average grain size value to a aztm grain size specimen does not adequately characterize the appearance of that specimen, and ee1181 even misrepresent its appearance.
Use one of the procedures from 8. If microscopic examination is subsequently necessary, individual specimens must be taken to allow estimation of area fractions for the entire product cross-section, and to allow determination of grain sizes representing the entire cross-section as well. The most precise estimate of the area fractions occupied by each grain size aatm be obtained by evaluating the entire surface of that specimen. Four procedures for estimating area fraction are described, the simplest to apply resulting in the least precision, and the most complicated resulting in the greatest precision.
Precision and Bias 9. If microscopic examination is subsequently necessary, individual specimens must be taken to allow estimation of area fractions for axtm entire product cross-section, and to allow determination of grain sizes representing the entire crosssection as well. These are available from microscope manufacturers. For instance, banding present in a given specimen may not be easily recognizable in a transverse orientation.
E — 02 The test methods provide for reporting of specic, distinctive information for each type of duplex grain size. The software provides fast and accurate detection of grain e1118 or grain face areas.
ASTM E – 02() – Standard Test Methods for Characterizing Duplex Grain Sizes
All required measurements are displayed in the “Current Field Results” box. If duplex grain size is suspected in a product too large to be polished and etched as a single specimen, macroetching should be considered as a rst step in evaluation.
This standard is subject to revision at any time by asrm responsible technical committee and must be reviewed every ve years and if not revised, either reapproved or withdrawn.
Measures grain boundary intercept distances or individual grain areas. Accordingly, the longitudinal orientation is recommended, with one exception.
Users easily set asm, choose preparation options and set the desired measurement method. Duplex grain structures for example, multiphase alloys are not necessarily duplex in grain size, and as such are not the subject of these methods.
Note that it is not necessary to resolve the individual ne grains in the image. Historical Version s – view previous versions of standard.
On d1181 overlay, also mark the outline of the total eld of view the limits of the image. Examples of random duplex grain sizes include: These different applications are described in 8.
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This comparison chart is shown in Fig. For all other products, area fraction estimates should be equally accurate with either specimen orientation. The entire macroetched cross-section should be used as a basis for estimating area fractions occupied by distinct grain sizes, if possible. Of these, the Comparison Procedure is the simplest, but offers the least precision.
The histogram suggests that the specimen evaluated contains more than a single distribution of grain sizes. All controls necessary for measurement are found on the easy to use control panel shown here. Duplex grain structures for example, multiphase alloys are not necessarily duplex in grain size, and as such are not the subject of these methods.
ASTM E1181 – 02(2015)
An example photomicrograph of the ALA condition appears in Fig. Dividing that value by the magnication of the photomicrographgives an actual average intercept e11181 of 0. Results will be incorporated here when available.
Next apply a regular two-dimensional grid to the outlined image.